| Current 
    Research on Molecular Processing Technological Applications
 Electron induced reactions in both gaseous 
    and condensed phases underpin many areas of applied and industrial research, 
    and are fundamental to the operation of all plasma-based processing. For 
    example, secondary electron cascades in mixed radioactive/chemical waste 
    drive much of the chemistry that determines how those materials age, change, 
    and interact with the natural environment. Electron collisions create the 
    reactive molecular fragments in the plasma devices being used in clean 
    technology e.g. for environmental remediation of NOx emission of combustion 
    exhausts and the development of ozone generators to control bacterial growth 
    in water treatment plants and retail food outlets.  Electron induced reactions also underpin the multibillion dollar modern 
    semiconductor industry since it is the reactive fragments produced by 
    electron impact of etchant gases that react with the silicon substrate 
    rather than the parent compound. However despite its high costs (>$1 billion 
    a plant) and technological importance most of the plasma processing 
    protocols and equipment have been designed empirically. Indeed the 1996 US 
    National Research Council Board report on plasma processing stated that 
    ‘plasma process control remains largely rudimentary and is performed 
    predominantly by trial and error’, an expensive procedure which limits 
    growth and innovation of the industry. In the last eight years US and 
    Japanese research communities (supported by their manufacturing industry) 
    have been developing research programmes to understand properties and 
    mechanisms of technological plasmas.  Major research effort has been directed towards (i) developing new 
    techniques for in situ plasma diagnosis and (ii) employing large scale 
    computer modelling to simulate conditions within such plasmas. Studies aim 
    to elucidate the plasma characteristics through an understanding of the 
    fundamental atomic and molecular physics and place this technology on a firm 
    theoretical basis. The ultimate goal being to advance our understanding of 
    plasma characteristics to such a level that it will be possible to custom 
    design, through computer models plasma reactors for any specified commercial 
    requirement (the ‘virtual factory’). To date these goals have only been 
    partially met. While the diagnostics of such plasmas are increasingly well 
    established, computer simulations remain inadequate and are unable to 
    provide the technologist with any realistic predictions as to the operation 
    of new reactor designs and processes.  Growing environmental concerns on the climatic effect of emissions of 
    current plasma reactants (most of the compounds being strong greenhouse 
    gases and/or ozone depletion compounds) have forced the industry to seek 
    replacement etching gases, requiring the design of new reactors. The plasma 
    industry has recently reinforced its call to the academic community to 
    develop its ‘virtual factory’ programme allowing new reactors/plants to be 
    developed computationally prior to the construction of commercial plants.
     Models of technological plasmas require quantitative data on the 
    reactions of all the constituent neutral species and ions. The 1996 US 
    report stated ‘ The main road block to the development of plasma models is 
    the lack of fundamental data on collisional, reactive processes occurring in 
    the plasma. Among the most important missing data are the identities of key 
    chemical species and the dominant kinetic pathways that determine the 
    concentrations and reactivates of these key species, especially for the 
    complex gas mixtures commonly used in industry’. Electron collisions 
    initiate almost all of the relevant chemistry associated with the technology 
    of plasma processing. Electron collision processes involving all possible 
    reactants, products, and intermediates must be investigated. Dissociation, 
    ionisation and attachment cross sections are of particular importance since 
    they determine the ionisation balance within the plasma and thus influence 
    plasma properties such as the electron energy distribution, which in turn 
    influences etch and deposition characteristics of plasmas. Therefore an 
    important part of this programme will be to study electron induced processes 
    pertinent to the modern plasma processing industry in both the gaseous and 
    condensed phase. |